The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Sep. 26, 2014
Synopsys, Inc., Mountain View, CA (US);
Victor Moroz, Saratoga, CA (US);
Stephen Lee Smith, Mountain View, CA (US);
Yong-Seog Oh, Pleasanton, CA (US);
Jie Liu, San Jose, CA (US);
Michael C. Shaughnessy-Culver, Santa Clara, CA (US);
Terry Sylvan Kam-Chiu Ma, Danville, CA (US);
SYNOPSYS, INC., Mountain View, CA (US);
Abstract
Roughly described, a technique for approximating a target property of a target material is provided. For each material in a plurality of anchor materials, a correspondence is provided between the value for a predetermined index property of the material and a value for the target property of the material, the values of all the index properties being different. A predictor function is identified in dependence upon the correspondence. A computer system determines a value for the target property for the target material in dependence upon the predictor function and a value for the index property for the target material. The determined value for the target property for the target material is reported to a user. The correspondence can be provided in a database on a non-transitory computer readable medium. The correspondence can be determined experimentally or analytically for each material in a plurality of anchor materials.