The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Jul. 11, 2014
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Atsushi Kamino, Tokyo, JP;

Hisayuki Takasu, Tokyo, JP;

Hirobumi Muto, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/08 (2006.01); H01J 37/16 (2006.01); H01J 37/18 (2006.01); H01J 37/20 (2006.01); H01J 37/305 (2006.01);
U.S. Cl.
CPC ...
H01J 37/08 (2013.01); H01J 37/16 (2013.01); H01J 37/18 (2013.01); H01J 37/20 (2013.01); H01J 37/3053 (2013.01); H01J 2237/006 (2013.01); H01J 2237/06 (2013.01); H01J 2237/08 (2013.01); H01J 2237/182 (2013.01); H01J 2237/184 (2013.01); H01J 2237/1825 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/2002 (2013.01); H01J 2237/31749 (2013.01);
Abstract

This ion milling device is provided with a vacuum chamber (), an exhaust device () for evacuating the interior of the vacuum chamber, a sample stage () for supporting a sample () to be irradiated inside the vacuum chamber, a heater () for heating the interior of the vacuum chamber, a gas source () for introducing into the vacuum chamber a gas serving as a heating medium, and a controller () for controlling the gas source, the controller controlling the gas source so that the vacuum chamber internal pressure is in a predetermined state during heating by the heater. This enables the control in a short time of the temperature for suppressing condensation, or the like, occurring at atmospheric release after cooling and ion milling a sample.


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