The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Dec. 14, 2017
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Richard Kwant, Oakland, CA (US);

Anish Mittal, Berkeley, CA (US);

David Lawlor, Chicago, IL (US);

Zhanwei Chen, Oakland, CA (US);

Himaanshu Gupta, San Francisco, CA (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06K 9/6265 (2013.01); G06N 20/00 (2019.01);
Abstract

An approach is provided for using one or more skip areas to label, train, and/or evaluate a machine learning model. The approach, for example, involves specifying the one or more skip areas with respect to an image. By way of example, a non-skip area of the image is a portion of the image that is not in the one or more skip areas. The approach also involves initiating a labeling of one or more features in the non-skip area of the image while excluding the one or more skip areas from the labeling to create a partially labeled image. The partially labeled image is then included in a training dataset for training a machine learning model.


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