The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Aug. 23, 2016
Applicant:

Mks Instruments, Inc., Andover, MA (US);

Inventors:

Junhua Ding, Boxborough, MA (US);

Michael L'Bassi, Sterling, MA (US);

Assignee:

MKS Instruments, Inc., Andover, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 7/06 (2006.01); G01F 1/36 (2006.01); G01F 1/50 (2006.01); G01F 15/00 (2006.01);
U.S. Cl.
CPC ...
G05D 7/0635 (2013.01); G01F 1/363 (2013.01); G01F 1/50 (2013.01); G01F 15/005 (2013.01);
Abstract

Methods, systems, and apparatus for pressure-based flow measurement are provided. A processor receives, from the pressure-based mass flow controller (MFC), an upstream pressure value P. The processor computes, for the pressure-based mass flow controller (MFC), a downstream pressure value Pbased on the received upstream pressure value P. The processor computes, for the pressure-based mass flow controller (MFC), a flow rate Q based on the received upstream pressure value Pand the computed downstream pressure value P. The processor controls a flow through the pressure-based mass flow controller (MFC) based on the computed flow rate Q. The methods, systems, and apparatus can be used for flow measurement in non-critical or un-choked flow conditions.


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