The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Sep. 09, 2016
Applicant:

Intel Ip Corporation, Santa Clara, CA (US);

Inventors:

Yunshuai Tang, Xi'an, CN;

Yanzeng Fu, Xi'an, CN;

Hong Zhang, Xi'an, CN;

Jie Lei, Xi'an, CN;

Zhen Wang, Xi'an, CN;

Assignee:

INTEL IP CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/00 (2006.01); H04L 25/02 (2006.01); H04L 27/26 (2006.01); H04L 25/03 (2006.01);
U.S. Cl.
CPC ...
H04L 27/0014 (2013.01); H04L 25/02 (2013.01); H04L 25/03159 (2013.01); H04L 25/03821 (2013.01); H04L 27/26 (2013.01); H04L 2025/03611 (2013.01); H04L 2027/0026 (2013.01); H04L 2027/0067 (2013.01);
Abstract

An apparatus to estimate a frequency offset in wireless networks is provided. The apparatus comprises: radio frequency (RF) circuitry to down-convert a signal from a base station to generate in-phase and quadrature (IQ) components, wherein the signal includes one or more repeated bursts; and a frequency offset estimator operatively coupled to the RF circuitry, the frequency offset estimator to estimate a frequency offset based on the IQ components and an iterative calculation of phase differences between different sets of bursts of the one or more repeated bursts.


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