The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Jul. 24, 2018
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

I-Hsiu Wang, Tainan County, TW;

Yean-Zhaw Chen, Tainan, TW;

Ying-Ting Hsia, Kaohsiung, TW;

Jhao-Ping Jiang, Changhua County, TW;

Chun-Chih Cheng, Changhua County, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/308 (2006.01); H01L 29/08 (2006.01); H01L 21/8238 (2006.01); H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0847 (2013.01); H01L 21/3085 (2013.01); H01L 21/76829 (2013.01); H01L 21/823814 (2013.01); H01L 21/823821 (2013.01); H01L 23/5329 (2013.01); H01L 29/6656 (2013.01);
Abstract

A method for manufacturing a semiconductor device includes following operations. A semiconductor substrate is received. A first semiconductive layer over the semiconductor substrate is formed. A plurality of dopants are formed in a first portion of the first semiconductive layer. A second portion of the first semiconductive layer is removed to form a patterned first semiconductive layer. A first sidewall profile of the first portion after the removing the second portion of the first semiconductive layer is controlled by adjusting a distribution of the plurality of dopants in the first portion.


Find Patent Forward Citations

Loading…