The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Apr. 27, 2018
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Russell Schreiber, Austin, TX (US);

John Wuu, Fort Collins, CO (US);

Michael K. Ciraula, Fort Collins, CO (US);

Patrick J. Shyvers, Fort Collins, CO (US);

Assignee:

Advanced Micro Devices, Inc., Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 5/06 (2006.01); G06F 13/38 (2006.01); G06F 13/42 (2006.01); H01L 25/065 (2006.01); G06F 13/40 (2006.01);
U.S. Cl.
CPC ...
G06F 13/385 (2013.01); G06F 13/4004 (2013.01); G06F 13/4243 (2013.01); H01L 25/0657 (2013.01); H01L 2225/06517 (2013.01); H01L 2225/06544 (2013.01);
Abstract

A data processing system includes a processing unit that forms a base die and has a group of through-silicon vias (TSVs), and is connected to a memory system. The memory system includes a die stack that includes a first die and a second die. The first die has a first surface that includes a group of micro-bump landing pads and a group of TSV landing pads. The group of micro-bump landing pads are connected to the group of TSVs of the processing unit using a corresponding group of micro-bumps. The first die has a group of memory die TSVs. The subsequent die has a first surface that includes a group of micro-bump landing pads and a group of TSV landing pads connected to the group of TSVs of the first die. The first die communicates with the processing unit using first cycle timing, and with the subsequent die using second cycle timing.


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