The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Jan. 06, 2006
Applicants:

Satoshi Takei, Toyama, JP;

Tetsuya Shinjo, Toyama, JP;

Keisuke Hashimoto, Toyama, JP;

Yasushi Sakaida, Toyama, JP;

Inventors:

Satoshi Takei, Toyama, JP;

Tetsuya Shinjo, Toyama, JP;

Keisuke Hashimoto, Toyama, JP;

Yasushi Sakaida, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/09 (2006.01); G03F 7/26 (2006.01); G03F 7/30 (2006.01);
U.S. Cl.
CPC ...
G03F 7/091 (2013.01); G03F 7/094 (2013.01); G03F 7/26 (2013.01); G03F 7/30 (2013.01);
Abstract

There is provided an underlayer coating forming composition for lithography that is used in lithography process of the manufacture of semiconductor devices and that has a high dry etching rate in comparison to photoresists, does not intermix with photoresists, and is capable of flattening the surface of a semi conductor substrate having holes of a high aspect ratio. The underlayer coating forming composition for lithography comprises, a compound having two or more protected carboxylic groups, a compound having two or more epoxy groups, and a solvent.


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