The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Jun. 02, 2016
Applicants:

Mitsubishi Gas Chemical Company, Inc., Tokyo, JP;

Mgc Filsheet Co., Ltd., Saitama, JP;

Inventors:

Takeshi Onishi, Fukushima, JP;

Masahide Takeda, Tokyo, JP;

Shotaro Ohno, Tokyo, JP;

Shohei Takahagi, Fukushima, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); F21V 3/00 (2015.01); F21S 2/00 (2016.01); F21V 3/04 (2018.01); G02B 5/02 (2006.01); B29C 48/30 (2019.01); B29C 48/305 (2019.01);
U.S. Cl.
CPC ...
G02F 1/133504 (2013.01); B29C 48/30 (2019.02); B29C 48/305 (2019.02); F21S 2/00 (2013.01); F21V 3/00 (2013.01); F21V 3/04 (2013.01); G02B 5/02 (2013.01); G02B 5/0205 (2013.01); G02F 1/1335 (2013.01); G02F 1/133606 (2013.01); Y10T 428/10 (2015.01); Y10T 428/1036 (2015.01);
Abstract

Provided is a polymer film which can eliminate both moire and glitter and is suitable for use as a diffusion film. The above-mentioned problems are solved with a polymer film, a surface of which has an arithmetic average roughness Ra of 0.63-1.80 μm, a root mean square roughness Rq of 0.76-2.40 μm, and an average height Rc of roughness-curve elements of 2.45-7.20 μm.


Find Patent Forward Citations

Loading…