The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Oct. 27, 2017
Applicant:

The 13th Research Institute of China Electronics Technology Group Corporation, Shijiazhuang, CN;

Inventors:

Yuanjie Lv, Shijiazhuang, CN;

Xubo Song, Shijiazhuang, CN;

Zhihong Feng, Shijiazhuang, CN;

Yuangang Wang, Shijiazhuang, CN;

Xin Tan, Shijiazhuang, CN;

xingye Zhou, Shijiazhuang, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/30 (2006.01); H01L 21/02 (2006.01); H01L 29/66 (2006.01); H01L 21/3065 (2006.01); H01L 21/265 (2006.01); H01L 21/308 (2006.01); H01L 21/306 (2006.01); H01L 29/78 (2006.01); H01L 29/24 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66969 (2013.01); H01L 21/265 (2013.01); H01L 21/308 (2013.01); H01L 21/3065 (2013.01); H01L 21/30604 (2013.01); H01L 29/24 (2013.01); H01L 29/78 (2013.01); H01L 21/02483 (2013.01); H01L 21/02502 (2013.01); H01L 21/02565 (2013.01); H01L 21/02581 (2013.01);
Abstract

A method for preparing a cap-layer-structured gallium oxide field effect transistor, includes: removing a gallium oxide channel layer and a gallium oxide cap layer from a passive area of a gallium oxide epitaxial wafer; respectively removing the gallium oxide cap layer corresponding to a source region of the gallium oxide epitaxial wafer and the gallium oxide cap layer corresponding to a drain region of the gallium oxide epitaxial wafer; respectively doping a portion of the gallium oxide channel layer corresponding to the source region and a portion of the gallium oxide channel layer corresponding to the drain region with an N-type impurity; respectively capping an upper surface of the gallium oxide channel layer corresponding to the source region and an upper surface of the gallium oxide channel layer corresponding to the drain region with a first metal layer to respectively form a source and a drain; and forming a gate.


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