The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Dec. 19, 2014
Carl Zeiss Microscopy Gmbh, Jena, DE;
Wolfgang Bathe, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention relates to a multi-color scanning microscope comprising at least one first light source for emitting a first excitation beam comprising first excitation light having a first wavelength and a second light source for emitting a second excitation beam comprising second excitation light having a second wavelength, which differs from the first wavelength, comprising coupling-in means for coupling the first excitation beam and/or the second excitation beam into an excitation beam path, comprising optical means for guiding the first excitation beam and the second excitation beam to a sample and for guiding detection light emitted by the sample in a detection beam path to a detection unit, wherein the optical means comprise at least the following components: at least one first main color splitter for separating the first excitation light and/or the second excitation light, on the one hand, from the detection light emitted by the sample, on the other hand, a scanner for scanning the sample with at least the first excitation light and the second excitation light, a microscope objective for focusing the first excitation light and the second excitation light onto or into the sample and for guiding the detection light emitted by the sample in the direction of the detection unit, and comprising the detector unit for detecting the detection light emitted by the sample. The microscope is characterized in that the coupling-in means and at least parts of the optical means are designed and arranged in such a way that the first excitation beam having the first wavelength is guided onto a first sample location and the second excitation beam having the second wavelength is guided onto a second sample location, which differs from the first sample location, and in that the detector unit comprises a first detector for detecting the light emitted by the first sample location and a second detector for detecting the light emitted by the second sample location.