The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10498469 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 03, 2019

Filed:

May. 21, 2018
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Mor Cohen, Haifa, IL;

Amir Mezer, Haifa, IL;

Golan Perry, Haifa, IL;

Adee Ofir Ran, Maayan Baruch, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 9/00 (2006.01); H04B 17/29 (2015.01); H04L 12/26 (2006.01); H04B 1/16 (2006.01);
U.S. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 1/16 (2013.01); H04L 43/087 (2013.01); H04L 43/0823 (2013.01); H04L 43/50 (2013.01);
Abstract

In accordance with embodiments disclosed herein, there is provided systems and methods for on-chip jitter tolerance testing. A receiver component includes a clock data recovery (CDR) logic circuit. The CDR logic circuit includes a controller to receive a phase signal and to output a DCO control signal; jitter injection (JINJ) logic to generate a first jitter signal at a first frequency and a first amplitude; and digitally controlled oscillator (DCO) to receive the first jitter signal applied to the DCO control signal and to output, based on the first jitter signal applied to the DCO control signal, a first DCO clock signal for on-chip jitter tolerance testing.


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