The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Jul. 09, 2018
Micron Technology, Inc., Boise, ID (US);
Yihua Zhang, Folsom, CA (US);
Paolo E. Mangalindan, Rancho Cordova, CA (US);
Jianfei Lei, Folsom, CA (US);
Andrew D. Proescholdt, Rancho Cordova, CA (US);
Gerard A. Kreifels, El Dorado Hills, CA (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Methods, systems, and devices for operating a memory cell or cells are described. An error in stored data may be detected by an error correction code (ECC) operation during sensing of the memory cells used to store the data. The error may be indicated in hardware by generating a measurable signal on an output node. For example, the voltage at the output node may be changed from a first value to a second value. A device monitoring the output node may determine an error has occurred for a set of data based at least in part on the change in the signal at the output node.