The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2019
Filed:
Jan. 12, 2018
Mitutoyo Corporation, Kanagawa, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
A hardness tester includes a measurer (CPU) measuring a value for a material characteristic of a sample in conjunction with formation of an indentation, an acquirer (CPU) acquiring measurement data associated with the value for the material characteristic of the sample measured by the measurer, and a determiner (CPU) accumulating a predetermined value for the material characteristic based on the measurement data acquired by the acquirer and determining a time to replace the indenter based on the accumulated value for the material characteristic.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile