The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Feb. 13, 2019
GE Sensing & Inspection Technologies Gmbh, Hurth, DE;
Reinhard Prause, Sankt Augustin, DE;
Wolfgang Dick, Hurth, DE;
GE Sensing & Inspection Technologies GmbH, Hurth, DE;
Abstract
Embodiments relate to a method for ultrasonic testing according to the pulse-echo method as well as an arrangement for performing such a method. By means of an ultrasonic transducer, an ultrasonic pulse is obliquely incident into a sound incidence surface of a test object. Next, an echo signal is received from the test object. This takes place either by means of the ultrasonic transducer, which has emitted the ultrasonic pulse or with another ultrasonic transducer. The time amplitude characteristic of the echo signal is evaluated in a predefined defect expectation interval of time. The evaluation step includes, in at least one section of the amplitude characteristic, an amplification of the amplitude and/or a reduction in the threshold value. For example, the amplitude of the received echo signal is then compared with the predefined threshold value.