The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Sep. 27, 2018
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Haining Yang, San Diego, CA (US);

Xiangdong Chen, San Diego, CA (US);

John Jianhong Zhu, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 23/522 (2006.01); H01L 29/78 (2006.01); H01L 27/092 (2006.01); H01L 21/8238 (2006.01); H01L 21/762 (2006.01); H01L 21/768 (2006.01); H01L 23/528 (2006.01); H01L 23/535 (2006.01); H01L 29/423 (2006.01); H01L 29/06 (2006.01); H01L 29/417 (2006.01); H01L 29/66 (2006.01); H01L 29/10 (2006.01);
U.S. Cl.
CPC ...
H01L 23/5228 (2013.01); H01L 21/76224 (2013.01); H01L 21/76816 (2013.01); H01L 21/76895 (2013.01); H01L 21/823821 (2013.01); H01L 21/823871 (2013.01); H01L 21/823878 (2013.01); H01L 23/528 (2013.01); H01L 23/5226 (2013.01); H01L 23/5283 (2013.01); H01L 23/535 (2013.01); H01L 27/092 (2013.01); H01L 27/0924 (2013.01); H01L 29/785 (2013.01); H01L 21/823807 (2013.01); H01L 29/0665 (2013.01); H01L 29/0673 (2013.01); H01L 29/1037 (2013.01); H01L 29/41791 (2013.01); H01L 29/42392 (2013.01); H01L 29/66795 (2013.01);
Abstract

Integrated circuits (ICs) employing additional output vertical interconnect access(es) (via(s)) coupled to a circuit output via to decrease circuit output resistance and related methods are disclosed. In exemplary aspects, an output metal interconnect is formed in the IC that extends between a first output contact connected to an output transistor(s) of a circuit, and across an adjacent dummy gate to a second output contact area on the opposite side of the dummy gate from the signal output node. A second output via is connected to the output metal interconnect in the second output contact area. A metal line in a metal layer above the diffusion area and metal contacts is connected to the output via and second output via having parallel output via resistances to reduce the output via resistance of the output transistor(s) of the circuit, and thus reduces the overall resistance of the signal output node of the circuit.


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