The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Feb. 26, 2018
Applicant:

United Microelectronics Corp., Hsinchu, TW;

Inventors:

Da-Ching Liao, Taichung, TW;

Li-Chin Wang, Tainan, TW;

Ya-Ching Cheng, Hsinchu, TW;

Chien-Hung Chen, Hsinchu County, TW;

Chun-Liang Hou, Hsinchu County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/06 (2006.01); G06F 17/50 (2006.01); G06F 17/15 (2006.01);
U.S. Cl.
CPC ...
G06F 17/15 (2013.01); G06F 7/06 (2013.01); G06F 17/50 (2013.01);
Abstract

An analyzing method and an analyzing system for manufacturing data are provided. The analyzing method includes the following steps. A plurality of models each of which has a correlation value representing a relationship between at least one of a plurality of factors and a target parameter are provided. The models are screened according to the correlation values. A rank information and a frequency information of the factors are listed up according to the models. The factors are screened according to the rank information and the frequency information. The models are ranked and at least one of the models is selected.


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