The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Jun. 02, 2014
Applicants:

Mark Backues, San Diego, CA (US);

Paul Aoyagi, Sunnyvale, CA (US);

Leonid Poslavsky, Belmont, CA (US);

Inventors:

Mark Backues, San Diego, CA (US);

Paul Aoyagi, Sunnyvale, CA (US);

Leonid Poslavsky, Belmont, CA (US);

Assignee:

KLA-TENCOR CORPORATION, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01N 21/47 (2006.01); G01N 21/956 (2006.01); G01M 11/02 (2006.01); G01N 21/21 (2006.01); G03F 7/20 (2006.01); G06F 17/40 (2006.01); G06F 19/00 (2018.01); G06F 11/30 (2006.01); H05K 13/08 (2006.01); G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4788 (2013.01); G01M 11/025 (2013.01); G01N 21/211 (2013.01); G01N 21/956 (2013.01); G03F 7/70625 (2013.01); G01B 11/30 (2013.01); G01B 2210/56 (2013.01); G01N 2021/213 (2013.01); G01N 2021/214 (2013.01); G06F 11/30 (2013.01); G06F 17/40 (2013.01); G06F 19/00 (2013.01); H05K 13/08 (2013.01);
Abstract

Automatic determination of Fourier harmonic order for computation of spectral information for diffraction structures described. An embodiment of a method includes automatically determining a Fourier harmonic order for computation of spectral information for periodic structures, wherein the determination of the Fourier harmonic order is based at least in part on the pitches in each of multiple directions of the periodic structures, material properties of the periodic structures, and characteristics of the periodic structures in which the materials are contained; and computing the spectral information for the periodic structures based at least in part on the determined Fourier harmonic order.


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