The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Feb. 22, 2018
Applicant:

Mitutoyo Corporation, Kawasaki, Kanagawa, JP;

Inventors:

Kentaro Tamura, Tokyo, JP;

Masaoki Yamagata, Kanagawa, JP;

Assignee:

MITUTOYO CORPORATION, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01C 3/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/02 (2013.01); G01C 3/00 (2013.01);
Abstract

Provided is an optical displacement meter capable of enlarging an output signal region with respect to a region in which a light-receiving amount needs to be measured, a method for adjusting an optical displacement meter, and an optical displacement measuring method. The optical displacement meter includes a light-receiving element in which a maximum value of an output signal is set with respect to a boundary value, which is a maximum value of a region in which the light-receiving amount needs to be measured. The entire region of the output signal of the light-receiving element can be assigned to the valid region, in which the light-receiving amount needs to be measured with an optical displacement meter, and the optical displacement meter can have an enlarged output signal region with respect to the region in which the light-receiving amount needs to be measured.


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