The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Sep. 09, 2016
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Akira Ogawa, Kariya, JP;

Yoshitaka Noda, Kariya, JP;

Tetsuo Yoshioka, Kariya, JP;

Yuhei Shimizu, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B81C 1/00 (2006.01); G01P 15/08 (2006.01); G01P 15/125 (2006.01);
U.S. Cl.
CPC ...
B81C 1/00579 (2013.01); G01P 15/0802 (2013.01); G01P 15/125 (2013.01); B81B 2201/033 (2013.01); B81C 2201/0112 (2013.01); B81C 2201/0132 (2013.01); B81C 2201/0139 (2013.01); B81C 2201/0142 (2013.01); G01P 2015/0814 (2013.01); G01P 2015/0882 (2013.01);
Abstract

A semiconductor device production method includes performing trench etching to form a trench in a thickness direction of a semiconductor layer so that both of a first pattern portion and a second pattern portion whose side walls face each other across the trench are formed. In the trench etching, the semiconductor layer is etched and removed while a protective film is formed on a surface of the semiconductor layer, and the trench etching is performed so that the first pattern portion and the second pattern portion are configured to have a same potential or a same temperature during the trench etching.


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