The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Mar. 09, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Rana Hanocka, Tel Aviv, IL;

Shahar Fleishman, Hod Hasharon, IL;

Jackie Assa, Tel Aviv, IL;

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/32 (2017.01); G06T 3/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/32 (2017.01); G06T 3/0075 (2013.01); G06T 2207/10028 (2013.01);
Abstract

Techniques are provided for global (non-rigid) scan point registration between a scanned object and an associated model, from an arbitrary initial starting position, based on a combination of iterative coarse registration and fine registration. A methodology implementing the techniques according to an embodiment includes generating a model transformation based on a coarse registration between the model and the point scan. The method further includes calculating an alignment metric based on a distance measurement between the point scan and the transformed model. If the alignment metric exceeds a selected threshold value, a fine registration is performed between the transformed model and the point scan. Otherwise, the method continues by performing a random rotation of the model; a translation of the rotated model towards a centroid of the point scan; and iterating the coarse registration using the translated model until the alignment metric is achieved, after which the fine registration is performed.


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