The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Jul. 18, 2017
Applicant:
Nxp Usa, Inc., Austin, TX (US);
Inventors:
Xiankun Jin, Austin, TX (US);
Mark Stachew, Austin, TX (US);
Assignee:
NXP USA, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/27 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01);
Abstract
Analog-to-digital conversion is tested in-field using an on-chip built-in self-test (BIST) sub-circuit formed within an underlying integrated circuit. Processing cycles may be conscripted during an idle state when the analog-to-digital conversion is not needed. The BIST requires a test time which may be compared to an idle time. If the idle time exceeds the test time, then the BIST may be entirely performed. However, if the idle time is unknown or less than the test time, the BIST may be paused and resumed between subsequent idle states.