The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Dec. 29, 2017
Applicant:
Mitutoyo Corporation, Kawasaki, Kanagawa, JP;
Inventor:
Atsuya Niwano, Tokyo, JP;
Assignee:
MITUTOYO CORPORATION, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/38 (2006.01); G02B 7/182 (2006.01); G06F 3/147 (2006.01); G02B 5/08 (2006.01); G02B 27/04 (2006.01);
U.S. Cl.
CPC ...
G09G 5/38 (2013.01); G02B 7/1821 (2013.01); G06F 3/147 (2013.01); G02B 5/08 (2013.01); G02B 7/182 (2013.01); G02B 27/04 (2013.01); G09G 2340/0492 (2013.01); G09G 2380/10 (2013.01);
Abstract
A measurement instrument includes a display configured to display information; a display controller configured to control displaying of the information on the display; and a reflector configured to invert the information displayed on the display via specular reflection. Since the measurement instrument includes the reflector configured to invert the information displayed on the display via specular reflection, information can be seen via the reflector even when the information is difficult to read directly from the display. Thus, the measurement instrument can improve visibility of the information displayed on the display.