The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Nov. 08, 2017
Synopsys, Inc., Mountain View, CA (US);
Etienne Lepercq, Shrewsbury, MA (US);
Jiahua Zhu, West Boylston, MA (US);
Jiong Cao, Shanghai, CN;
Marc-Andre Daigneault, Marlborough, MA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
A computer-implemented method generates a plurality of clusters based on components included in a design under test (DUT); classifies a subset of clusters of the plurality of clusters as tangled clusters; modifies at least two tangled clusters of the subset of clusters based on overlap between the at least two tangled clusters; determines, for each tangled cluster in the subset of clusters, a gate count based on the interconnectivity of the tangled cluster; and partitions the DUT among a plurality of field-programmable gate arrays (FPGAs) based on the gate count determined for each tangled cluster from the subset of clusters.