The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Sep. 18, 2015
Hitachi High-technologies Corporation, Tokyo, JP;
Minoru Sano, Tokyo, JP;
Akihisa Makino, Tokyo, JP;
Chie Yabutani, Tokyo, JP;
Rei Konishi, Tokyo, JP;
Naoto Suzuki, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
The purpose of the present invention is to provide an automatic analysis device capable of efficiently performing a plurality of analyses, while reducing the footprint and cost of the device. Provided is an automatic analysis device characterized by being provided with containers for containing samples, one rack for placing the containers thereon, and a control unit, the control unit generating, with respect to the one rack, a plurality of registration patterns in which information of the positions where the containers are disposed, and information of the samples contained in the containers are correlated with each other, storing the registration patterns thus generated, applying, to the one rack, one registration pattern selected from among the registration patterns thus stored, and analyzing the samples. Also provided is an analysis method using the device.