The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Mar. 24, 2017
Applicant:

Keithley Instruments, Llc, Cleveland, OH (US);

Inventors:

Brian P. Frackelton, Macedonia, OH (US);

George J. Polly, Brecksville, OH (US);

Lawrence J. Kizlik, Eastlake, OH (US);

Assignee:

Keithley Instruments, LLC, Solon, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04Q 9/00 (2006.01); G06F 3/0481 (2013.01); H04L 12/26 (2006.01); G06F 3/0483 (2013.01);
U.S. Cl.
CPC ...
H04Q 9/00 (2013.01); H04L 43/50 (2013.01); G06F 3/0483 (2013.01); G06F 3/04817 (2013.01); G06F 2203/04803 (2013.01); H04Q 2209/84 (2013.01);
Abstract

The determination and rendering of scan groups for channels configured to acquire data from test and measurement devices in a data acquisition system is disclosed. Based on the particular scan configuration for the data acquisition system, scan groups may be determined for channels in a scan list based on the channel settings, such as measurement type, for example. The data acquisition system renders a graphical scan summary of the channels in the scan list according to their determined scan groups on a display, allowing a user to quickly review the scan configuration.


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