The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Apr. 19, 2018
Applicant:

Rambus Inc., Sunnyvale, CA (US);

Inventor:

Nanyan Wang, Cupertino, CA (US);

Assignee:

Rambus Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 7/02 (2006.01); H03K 9/02 (2006.01); H04L 25/06 (2006.01); H04L 5/00 (2006.01); H04L 25/49 (2006.01); H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
H04L 25/066 (2013.01); H04L 5/0048 (2013.01); H04L 25/4917 (2013.01); H04L 27/0002 (2013.01);
Abstract

In a PAM-N receiver, sampler reference levels, DC offset and AFE gain may be jointly adapted to achieve optimal or near-optimal boundaries for the symbol decisions of the PAM-N signal. For reference level adaptation, the hamming distances between two consecutive data samples and their in-between edge sample are evaluated. Reference levels for symbol decisions are adjusted accordingly such that on a data transition, an edge sample has on average, equal hamming distance to its adjacent data samples. DC offset may be compensated to ensure detectable data transitions for reference level adaptation. AFE gains may be jointly adapted with sampler reference levels such that the difference between a reference level and a pre-determined target voltage is minimized.


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