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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10460906 B1

PDFFull Text
Date of Patent:
Oct. 29, 2019

Filed:

Nov. 14, 2017

Method for monitoring environmental states of a microscope sample with an electron microscope sample holder

Applicant:

Protochips, Inc., Morrisville, NC (US);

Inventors:

Daniel Stephen Gardiner, Wake Forest, NC (US);

William Bradford Carpenter, Asheville, NC (US);

John Damiano, Jr., Apex, NC (US);

Franklin Stampley Walden, II, Raleigh, NC (US);

David P. Nackashi, Raleigh, NC (US);

Assignee:

PROTOCHIPS, INC., Morrisville, NC (US);

Attorney:

NK Patent Law

Primary Examiner:

Christine T Mui

Int. Cl.
CPC ...
H01J 37/26 (2006.01); G01K 11/32 (2006.01); G01L 11/02 (2006.01); H01J 37/16 (2006.01); H01J 37/20 (2006.01); G01L 19/04 (2006.01); H01J 37/317 (2006.01);
U.S. Cl.
CPC ...
H01J 37/261 (2013.01); G01K 11/32 (2013.01); G01L 11/025 (2013.01); G01L 19/04 (2013.01); H01J 37/16 (2013.01); H01J 37/20 (2013.01); H01J 37/3178 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/2002 (2013.01); H01J 2237/2801 (2013.01);
Abstract

An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.

Find Patent Forward Citations

Gardiner, Daniel. (2019). Method for monitoring environmental states of a microscope sample with an electron microscope sample holder (U.S. Patent No. 10460906). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10460906

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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