The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Jan. 28, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jeffrey W. Christensen, Katy, TX (US);

Phillip E. Christensen, Houston, TX (US);

Daniel E. Moore, Wake Forest, NC (US);

Antoine G. Sater, Houston, TX (US);

Jung H. Yoon, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/56 (2006.01); G11C 29/34 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01); G11C 29/38 (2006.01); G11C 16/04 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56008 (2013.01); G11C 16/04 (2013.01); G11C 29/38 (2013.01); G11C 29/44 (2013.01); G11C 29/50 (2013.01); G11C 29/50004 (2013.01); G11C 16/349 (2013.01);
Abstract

A computer-implemented method for sorting non-volatile random access memories (NVRAMS) includes testing a failure metric for each of a plurality of NVRAMS over a plurality of testing sessions to capture failure metric data that corresponds to the plurality of NVRAMS. The method also includes determining a trend in the failure metric as a function of testing cycles for each of the plurality of NVRAMS from the failure metric data, and separating the plurality of NVRAMS into groups based on the trend in the failure metric as a function of testing cycles. A corresponding computer program product and computer system are also disclosed herein.


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