The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Mar. 04, 2016
Applicant:

Central Glass Company, Limited, Ube-shi, Yamaguchi, JP;

Inventors:

Yosuke Nakamura, Tokyo, JP;

Masaki Fujiwara, Tokyo, JP;

Hiroyuki Oomori, Ube, JP;

Akifumi Yao, Ube, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07C 17/383 (2006.01); C07C 21/18 (2006.01); C09K 13/08 (2006.01); C23F 1/10 (2006.01); C23F 1/12 (2006.01); H01L 21/306 (2006.01); H01L 21/3065 (2006.01); H01L 21/3105 (2006.01); H01L 21/311 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
C09K 13/08 (2013.01); C07C 17/383 (2013.01); C07C 21/18 (2013.01); C23F 1/10 (2013.01); C23F 1/12 (2013.01); H01L 21/306 (2013.01); H01L 21/3065 (2013.01); H01L 21/30621 (2013.01); H01L 21/31055 (2013.01); H01L 21/31116 (2013.01); H01L 21/32135 (2013.01);
Abstract

What is disclosed is a dry etching gas containing 1,3,3,3-tetrafluoropropene, wherein 1,3,3,3-tetrafluoropropene has purity of 99.5 mass % or more, and a total of concentration of each mixed metal component of Fe, Ni, Cr, Al, and Mo is 500 mass ppb or less. Furthermore, regarding to the dry etching gas, it is preferable that a content of nitrogen is 0.5 volume % or less, and that a content of water is 0.05 mass % or less. In a dry etching with a plasma gas obtained by making a dry etching gas into plasma, the dry etching gas of the present invention can improve etching selectivity of silicon-based material with respect to a mask.


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