The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

May. 29, 2015
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Masaki Okude, Naka, JP;

Kenji Yamaguchi, Naka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23B 27/14 (2006.01); B23C 5/16 (2006.01); C23C 16/36 (2006.01); C23C 16/40 (2006.01); C23C 16/06 (2006.01); C23C 16/32 (2006.01); C23C 16/34 (2006.01); C23C 16/02 (2006.01);
U.S. Cl.
CPC ...
B23C 5/16 (2013.01); B23B 27/14 (2013.01); C23C 16/0272 (2013.01); C23C 16/06 (2013.01); C23C 16/32 (2013.01); C23C 16/34 (2013.01); C23C 16/36 (2013.01); C23C 16/40 (2013.01); C23C 16/403 (2013.01);
Abstract

In a surface-coated cutting tool, a hard coating layer composed of a lower layer and an upper layer is deposited on a surface of a tool body made of a WC-based cemented carbide or a TiCN-based cermet. The lower layer has at least one Ti compound layer made of a TiCN layer and the upper layer is made of an α-type AlOlayer. In a case where, regarding AlOcrystal grains of the entire upper layer, a constituent atom-sharing lattice point distribution is measured, a highest peak is present in Σ3, and a distribution ratio of Σ3 is 70% or more. A ratio of a Σ3-coincidence grain boundary continuing from an interface between the lower layer and the upper layer to an outermost surface of the upper layer is 60% or more of a Σ3-coincidence grain boundary of the upper layer.


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