The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Jun. 30, 2017
Samsung Display Co., Ltd., Yongin-si, Gyeonggi-do, KR;
Yiwei Zhang, Campbell, CA (US);
Janghwan Lee, Pleasanton, CA (US);
Samsung Display Co., Ltd., Yongin-si, KR;
Abstract
A method for detecting one or more white spot MURA defects in a display panel includes receiving an image of the display panel, the image including the one or more white spot MURA defects, dividing the image into a plurality of patches, each one of the plurality of patches corresponding to an m pixel by n pixel area of the image (wherein m and n are integers greater than or equal to one), generating a plurality of feature vectors for the plurality of patches, each of the feature vectors corresponding to one of the plurality of patches and including one or more image texture features and one or more image moment features, and classifying each one of the plurality of patches based on a respective one of the plurality of feature vectors by utilizing a multi-class support vector machine to detect the one or more white spot MURA defects.