The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Jan. 28, 2016
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Hideharu Hattori, Tokyo, JP;

Yasuki Kakishita, Tokyo, JP;

Kenko Uchida, Tokyo, JP;

Sadamitsu Aso, Tokyo, JP;

Fumiaki Hamazato, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G01N 33/483 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01N 33/4833 (2013.01); G06K 9/4604 (2013.01); G06K 9/6267 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30096 (2013.01);
Abstract

The present invention realizes determination of tissues and cells from an image by calculating feature values of a deformed degree of the cells even in a case where the tissues or the cells have various shapes. An image diagnosis support apparatus according to the present invention executes processing of inputting an image of cells, processing of extracting the feature values of a plurality of direction components from a target image of the processing, processing of determining whether or not the image corresponds to one-classification by using the plurality of feature values, and processing of determining whether or not the determination processing is finished with respect to all of the classifications set in advance (FIG.).


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