The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Sep. 22, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Ahmet Can Sitik, Hillsboro, OR (US);

Ankit More, Hillsboro, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/901 (2019.01); G06N 20/00 (2019.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06F 16/9024 (2019.01); G06N 5/022 (2013.01); G06N 20/00 (2019.01);
Abstract

Technologies for node-degree based clustering include a computing device to construct a graph that includes multiple vertices corresponding to the data points of a data set. The computing device inserts an edge between each pair of vertices that has a corresponding similarity metric that meets a predetermined threshold similarity metric. The computing device determines a node degree for each vertex in the graph and initializes a cutoff node degree as the lowest node degree of the vertices. The computing device selects a test subset of the graph that includes vertices having a node degree less than or equal to the cutoff node degree. The computing device determines whether the test subset covers the graph and if not increases the cutoff node degree. If the test subset covers the graph, the data points corresponding to the vertices of the test subset are the representative cluster. Other embodiments are described and claimed.


Find Patent Forward Citations

Loading…