The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Jun. 20, 2016
International Business Machines Corporation, Armonk, NY (US);
Eitan Daniel Farchi, Pardes-Hana, IL;
Andre Heilper, Haifa, IL;
Aviad Zlotnick, Mitzpeh Netofah, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, apparatus and product for utilizing semantic clusters to predict software defects. The method comprising: obtaining a plurality of software elements that are associated with a version of a System Under Test (SUT), wherein the plurality of software elements comprise defective software elements which are associated with a defect in the version of the SUT; defining, by a processor, a plurality of clusters, wherein each cluster of the plurality of clusters comprises software elements having an attribute, wherein the attribute is associated with a functionality of the SUT; and determining a score of each cluster of the plurality of clusters, wherein the score of a cluster is based on a relation between a number of defect software elements in the cluster and a number of software elements in the cluster.