The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Mar. 18, 2015
Applicant:
Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;
Inventors:
Motohiro Yamazaki, Tokyo, JP;
Yuichiro Ota, Tokyo, JP;
Satoshi Takahashi, Tokyo, JP;
Yoshitaka Kodama, Tokyo, JP;
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01J 3/44 (2006.01); G01N 27/447 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); G01J 3/0208 (2013.01); G01J 3/4406 (2013.01); G01N 27/447 (2013.01); G01N 27/44721 (2013.01); G01N 2021/6417 (2013.01); G01N 2021/6471 (2013.01); G01N 2201/06113 (2013.01);
Abstract
During analysis of samples of unknown concentration, situations frequently occur in which the dynamic range is insufficient, necessitating reanalysis. Accordingly, a fluorescence spectrometer which splits a single object image into multiple images having different fluorescent intensity by means of image splitting elements, and simultaneously detects the plurality of images obtained thereby in different regions within the same detection plane, is proposed.