The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

May. 31, 2018
Applicant:

Nanometrics Incorporated, Milpitas, CA (US);

Inventors:

Paul A. Doyle, Milpitas, CA (US);

Ryan Tsai, Sunnyvale, CA (US);

Morgan A. Crouch, Santa Clara, CA (US);

Assignee:

Nanometrics Incorporated, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/15 (2006.01); G03F 7/20 (2006.01); G01N 21/95 (2006.01); G03F 1/84 (2012.01); G01N 21/956 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01N 21/15 (2013.01); G01N 21/9501 (2013.01); G01N 21/956 (2013.01); G03F 1/84 (2013.01); G03F 7/7005 (2013.01); H01L 22/12 (2013.01); G01N 2021/151 (2013.01);
Abstract

A purge system includes a purge gas distribution manifold that includes at least one port through which light beam from an optical metrology or inspection head is transmitted. The purge gas distribution manifold includes a bottom surface having one or more apertures through which purge gas is expelled. The bottom surface is held in close proximity to the top surface of the substrate and the apertures may be distributed over the bottom surface of the purge gas distribution manifold so that purge gas is uniformly distributed over the entirety of the top surface of the substrate at all measurement positions of the substrate with respect to the optical metrology or inspection head.


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