The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Aug. 27, 2014
Applicants:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi, JP;

Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;

Inventors:

Hironori Daikoku, Susono, JP;

Motohisa Kado, Gotenba, JP;

Kazuhito Kamei, Tokyo, JP;

Kazuhiko Kusunoki, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 19/10 (2006.01); C30B 29/36 (2006.01); C30B 9/10 (2006.01); C30B 19/02 (2006.01); C30B 19/06 (2006.01); C30B 19/12 (2006.01); H01L 21/02 (2006.01); H01L 29/04 (2006.01); H01L 29/16 (2006.01); C30B 19/08 (2006.01);
U.S. Cl.
CPC ...
C30B 19/10 (2013.01); C30B 9/10 (2013.01); C30B 19/02 (2013.01); C30B 19/062 (2013.01); C30B 19/068 (2013.01); C30B 19/08 (2013.01); C30B 19/12 (2013.01); C30B 29/36 (2013.01); H01L 21/02529 (2013.01); H01L 21/02598 (2013.01); H01L 21/02609 (2013.01); H01L 21/02628 (2013.01); H01L 29/045 (2013.01); H01L 29/1608 (2013.01);
Abstract

Provided is a SiC single crystal that has a large growth thickness and contains no inclusions. A SiC single crystal grown by a solution process, wherein the total length M of the outer peripheral section formed by the {1-100} faces on the {0001} growth surface of the SiC single crystal, and the length P of the outer periphery of the growth surface of the SiC single crystal, satisfy the relationship M/P≤0.70, and the length in the growth direction of the SiC single crystal is 2 mm or greater.


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