The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Jan. 20, 2016
Applicant:

Mentor Graphics Corporation, Wilsonville, OR (US);

Inventor:

Sandeep Koranne, West Linn, OR (US);

Assignee:

Mentor Graphics Corporation, Wilsonville, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4099 (2006.01); G06F 17/17 (2006.01); B29C 64/386 (2017.01); B33Y 50/02 (2015.01); G02B 6/136 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); B29C 64/386 (2017.08); G06F 17/175 (2013.01); B33Y 50/02 (2014.12); G02B 6/136 (2013.01); G05B 2219/35134 (2013.01); G05B 2219/49007 (2013.01); Y02P 90/265 (2015.11);
Abstract

Methods and apparatus are disclosed for symbolic methods using algebraic geometry (e.g., based on a Gröbner basis of tangent space polynomials of parametric curves). For example, the design, optimization and verification of silicon photonic wave guides using parametric polynomials and/or Gröbner basis functions can be used to perform envelope generation, rectification, manufacturability checking, singularity detection, reticle and etch processing model generation, tapering loss minimization, and bend loss minimization. In one example, a method of analyzing a layout to be manufactured using a photolithographic process includes producing an envelope of a curve representing a layout object based at least in part on a Gröbner basis and performing one or more analysis operations for the envelope to perform verification and manufacturability checks.


Find Patent Forward Citations

Loading…