The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Dec. 11, 2018
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Takashi Kawamura, Kanagawa, JP;

Aya Yamamoto, Kanagawa, JP;

Shigenori Mattori, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H01Q 3/02 (2006.01); H01Q 3/00 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/02 (2013.01); H01Q 3/00 (2013.01);
Abstract

A distance between a center of a first probe antenna and a center of a second probe antenna in a measurement plane is longer than a distance between the center of the first probe antenna and a center of a third probe antenna in the measurement plane by a distance between two measurement positions adjacent to each other in a horizontal direction. A distance between a center of a fourth probe antenna and a center of a fifth probe antenna in the measurement plane is longer than a distance between the center of the fourth probe antenna and a center of a sixth probe antenna in the measurement plane by a distance between two measurement positions adjacent to each other in a vertical direction.


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