The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Jun. 20, 2017
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Shanen J. Boettcher, Bellevue, WA (US);

Yulin Jin, Redmond, WA (US);

Emmett Lalish, Seattle, WA (US);

Jesse McGatha, Sammamish, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 50/00 (2015.01); B29C 64/386 (2017.01); G06T 11/20 (2006.01); G06T 17/10 (2006.01); B29C 64/40 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B29C 64/386 (2017.08); B29C 64/40 (2017.08); G06T 11/203 (2013.01); G06T 17/10 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

The claimed subject matter includes a system and method to design 3D objects for fabrication. In embodiments, the method includes sampling coordinates of a two-dimensional object. The method also includes generating fabrication coordinates based on the sampled coordinates and a plane comprising a top layer of a three-dimensional (3D) object. Additionally, the method includes generating a 2D triangular mesh for the top layer of an overhang based on the sampled coordinates, an angle between the top layer and two points in a previous top layer border less than or equal to an overhang threshold angle.


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