The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Apr. 27, 2018
Anritsu Corporation, Kanagawa, JP;
Takahiro Kasagi, Kanagawa, JP;
Masahiro Aoyama, Kanagawa, JP;
Custodio Jean-Elaine Garcia, Kanagawa, JP;
Takashi Yanagimoto, Kanagawa, JP;
ANRITSU CORPORATION, Kanagawa, JP;
Abstract
A measurement deviceincludes a reception unitthat receives a frame transmitted from a DUT, an MCS determination unitthat determines whether or not a received MCS index of a frame received by the reception unitmatches a predetermined MCS index for comparison, a transmission unitthat transmits a notification signal to the DUT when the MCS determination unitdetermines that the received MCS index matches the MCS index for comparison, and does not transmit the notification signal to the DUT when the MCS determination unitdetermines that the received MCS index does not match the MCS index for comparison, and a measurement unitthat measures data under measurement included in the frame in which it is determined that the received MCS index matches the MCS index for comparison.