The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Aug. 22, 2017
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Hideyuki Nakagawa, Ibaraki, JP;

Nobuhiro Ishikawa, Ibaraki, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 5/012 (2006.01); G01B 21/04 (2006.01); G01B 7/012 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01B 5/012 (2013.01); G01B 5/008 (2013.01); G01B 7/012 (2013.01); G01B 11/005 (2013.01); G01B 21/042 (2013.01); G01B 21/045 (2013.01); G01B 21/047 (2013.01);
Abstract

As a former correction step, a coordinate correction method includes: a step of setting a measuring probe in a drive mechanism; a step of restraining a measurement tip; a step of acquiring a moving amount and a probe output; and a step of generating a former correction matrix including linear correction elements and non-linear correction elements. As a latter correction step, the coordinate correction method includes: a step of setting a measuring probe in a drive mechanism; a step of restraining a measurement tip; a step of acquiring a moving amount and a probe output; a step of generating an intermediate correction matrix including linear correction elements for correcting the probe output; and a step of correcting the probe output with a latter correction matrix. Consequently, correction can be simplified while allowing for correction of a non-linear error of the probe output supplied from the measuring probe.


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