The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Sep. 15, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Conal E. Murray, Yorktown Heights, NY (US);

Chih-Chao Yang, Glenmont, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/52 (2006.01); H01L 21/768 (2006.01); H01L 21/28 (2006.01); H01L 29/49 (2006.01); H01L 21/285 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76864 (2013.01); H01L 21/28088 (2013.01); H01L 21/76843 (2013.01); H01L 29/4966 (2013.01); H01L 21/28562 (2013.01);
Abstract

A method for manufacturing a semiconductor device includes conformally depositing a liner layer on a top surface of a dielectric layer, and on sidewall and bottom surfaces of an opening in the dielectric layer, annealing the liner layer, wherein the annealing is performed in at least one of a nitrogen (N) and ammonia (NH) ambient, at a temperature of about 60° C. to about 500° C., and at a power of about 200. Watts to about 4500. Watts, and forming a conductive layer on the liner layer on the top surface of the dielectric layer, and on the liner layer in a remaining portion of the opening.


Find Patent Forward Citations

Loading…