The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Oct. 15, 2014
Carl Zeiss Microscopy Gmbh, Jena, DE;
Max-planck-gesellschaft Zur Förderung Der Wissenschaften E.v., München, DE;
Helmut Lippert, Jena, DE;
Jörg Siebenmorgen, Jena, DE;
Jan Huisken, Dresden, DE;
Florian Fahrbach, Heidelberg, DE;
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e. V., Munich, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile