The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Sep. 21, 2015
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Andy C Chou, San Francisco, CA (US);

Jon Passki, Brooklyn, NY (US);

Romain Gaucher, San Francisco, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/56 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/562 (2013.01); G06F 2221/033 (2013.01);
Abstract

A method is provided to remediate defects in first computer program code that can be used to configure a computer to produce code for use by the same or a different computer configured using second computer program code to use the produced code to produce output information, the method comprising: configuring a computer to perform static analysis of the first program to produce an information structure in a non-transitory computer readable storage device that associates a respective code statement of the first program code with a respective context, wherein the context associates a parser state with a potential defect in the produced code; identify a defect in the first computer program code that is associated with the respective code statement; and determining a remediation for the identified defect.


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