The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
May. 17, 2013
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Masaki Yamano, Tokyo, JP;
Yoshiyuki Nakao, Tokyo, JP;
Shigetoshi Hyodo, Tokyo, JP;
Masaki Tanaka, Tokyo, JP;
Tsukasa Suda, Tokyo, JP;
NIPPON STEEL CORPORATION, Tokyo, JP;
Abstract
A method of adjusting flaw detection sensitivity on an array ultrasonic probe comprises disposing a plate material Poppositely to the ultrasonic probe such that an upper surface of the plate material is disposed to be approximately parallel to an array direction of the transducers, or disposing a tubular material Poppositely to the ultrasonic probe such that an axial direction of the tubular material is disposed to be approximately parallel to the array direction of the transducers. Ultrasonic waves are transmitted from each transducer toward the upper surface of the plate material or an outer surface of the tubular material, and echoes are received from the bottom surface of the plate material or an inner surface of the tubular material on each transducer. Flaw detection sensitivity of each transducer is adjusted to substantially equalize intensity of an echo received on each transducer.