The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Jul. 13, 2016
Applicant:
Rudolph Technologies, Inc., Bloomington, MN (US);
Inventors:
Robert Bishop, Newton, MA (US);
Timothy Pinkney, Cambridge, MA (US);
Assignee:
Rudolph Technologies, Inc., Wilmington, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/235 (2006.01); G01N 21/64 (2006.01); G01N 21/956 (2006.01); G01N 21/95 (2006.01); G01N 21/88 (2006.01); H04N 5/33 (2006.01); H04N 5/372 (2011.01); H04N 5/378 (2011.01); G03B 13/36 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2356 (2013.01); G01N 21/6456 (2013.01); G01N 21/8806 (2013.01); G01N 21/9501 (2013.01); G01N 21/956 (2013.01); H04N 5/332 (2013.01); H04N 5/378 (2013.01); H04N 5/37206 (2013.01); H04N 7/18 (2013.01); G01N 2021/6463 (2013.01); G01N 2021/95638 (2013.01); G01N 2201/062 (2013.01); G01N 2201/0612 (2013.01); G01N 2201/10 (2013.01); G03B 13/36 (2013.01);
Abstract
A method and apparatus for optimizing inspection high-speed optical inspection of parts using intelligent image analysis to determine optimal focus using high numerical aperture (NA) optics, achieve a superior signal-to-noise ratio, resolution, and inspection speed performance with very limited depth of field lenses.