The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Dec. 08, 2017
Applicants:

Meijo University, Nagoya-shi, Aichi, JP;

Stanley Electric Co., Ltd., Meguro-ku, Tokyo, JP;

Inventors:

Tetsuya Takeuchi, Nagoya, JP;

Isamu Akasaki, Nagoya, JP;

Takanobu Akagi, Yokohama, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/183 (2006.01); H01S 5/026 (2006.01); H01L 21/02 (2006.01); H01S 5/32 (2006.01); H01S 5/323 (2006.01); H01S 5/30 (2006.01);
U.S. Cl.
CPC ...
H01S 5/18377 (2013.01); H01S 5/026 (2013.01); H01S 5/18361 (2013.01); H01L 21/02365 (2013.01); H01S 5/18341 (2013.01); H01S 5/18369 (2013.01); H01S 5/3063 (2013.01); H01S 5/3201 (2013.01); H01S 5/32341 (2013.01); H01S 2304/04 (2013.01);
Abstract

Provided is a semiconductor multilayer film reflecting mirror formed by alternately repeating a first nitride film containing In (indium) and a second nitride film not containing In. The reflecting mirror includes an inter-film transition layer between the first and second nitride films, the composition of which is varied from the composition of the first nitride film to the composition of the second nitride film. The inter-film transition layer has a first transition layer formed on the first nitride film and containing In and Al (aluminum), and a second transition layer formed on the first transition layer and containing Al but not containing In. In the first transition layer, the percentages of In and Al are decreased from the first nitride film to the second transition layer, and the percentage of In in the first transition layer starts to decrease at a same or closer position to the first nitride film than the percentage of Al.


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