Memory circuit march testing

Abstract

Embodiments include novel approaches for scan-based device testing using a march controller. A march data store can have sets of march element data stored thereon, each defining a respective march element of a march test sequence. A march select register can select each stored set of march element data according to the predefined march test sequence, and a march data loader can iteratively and sequentially output each set of march element data selected by the march select register. A memory built-in self-test controller can generate, in response to receiving each set of march element data output by the march controller, test stimulus data corresponding to the received set of march element data. The test stimulus data can input to a scan chain of the integrated circuit under test, and response data can be captured from the scan chain and assessed to determine whether the integrated circuit passed the test.